Progress in resonant inelastic x-ray scattering

Journal of Electron Spectroscopy and Related Phenomena

Volumn 188, Issue , 2013, Pages 1-2

  Simon, Marc ^a   Schmitt, Thorsten ^b  

^a Lab Phys Matiere Cond l'Ecl N   (France)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84886425038     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2013.07.002     Document Type: Editorial

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