The role of tetragonal side morphotropic phase boundary in modified relaxor-PbTiO3 crystals for high power transducer applications

Journal of Applied Physics

Volumn 114, Issue 14, 2013, Pages

  Kong, Lingping ^a,b,c   Liu, Gang ^a,b,d   Zhang, Shujun ^d   Liu, Haozhe ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

^b CENTER FOR HIGH PRESSURE SCIENCE AND TECHNOLOGY ADVANCED RESEARCH   (China)

^c HPSynC   (United States)

^d PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MEASUREMENTS; HIGH CURIE TEMPERATURE; MORPHOTROPIC PHASE BOUNDARIES; RAMAN CHARACTERIZATION; STRUCTURAL INSTABILITY; STRUCTURE/PROPERTY RELATIONSHIPS; TEMPERATURE STABILITY; X-RAY SYNCHROTRON;

FERROELECTRIC MATERIALS; LEAD;

TRANSDUCERS;

EID: 84886065813     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4824185     Document Type: Article

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