Relating sinusoid to random vibration for electronic packaging testing

InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, ITHERM

Volumn 2002-January, Issue , 2002, Pages 892-895

  Wang, F F ^a  

^a M/S M3 49   (United States)

Author keywords

Acceleration; Damping; Electronic equipment testing; Electronics packaging; Life estimation; Mathematics; Qualifications; Resonance; Resonant frequency; Vibrations

Indexed keywords

ACCELERATION; DAMPING; ELECTRONIC EQUIPMENT; ELECTRONICS PACKAGING; EQUIPMENT TESTING; FREQUENCY ESTIMATION; MATHEMATICAL TECHNIQUES; NATURAL FREQUENCIES; OSCILLATORS (ELECTRONIC); RESONANCE;

DAMAGING EFFECTS; ELECTRONIC PACKAGING; EQUIVALENT DAMAGE; LIFE ESTIMATION; QUALIFICATIONS; RANDOM VIBRATION TESTING; RANDOM VIBRATIONS; VIBRATIONS;

ELECTRONIC EQUIPMENT TESTING;

EID: 84885857999     PISSN: 19363958     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ITHERM.2002.1012549     Document Type: Conference Paper

References (8)

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