메뉴 건너뛰기




Volumn , Issue , 2013, Pages 226-229

Phønix: Reviving MLC blocks as SLC to extend NAND flash devices lifetime

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE LIFETIME; LIFETIME EXTENSION; MEMORY REQUIREMENTS; MULTI LEVEL CELL (MLC); MULTIPLE BITS; NAND FLASH; PERFORMANCE LOSS; SINGLE-BIT;

EID: 84885672174     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (22)

References (13)
  • 2
    • 84863541715 scopus 로고    scopus 로고
    • Software controlled cell bit-density to improve NAND flash lifetime
    • San Francisco, California, USA, Jun.
    • X. Jimenez, D. Novo, and P. Ienne, "Software controlled cell bit-density to improve NAND flash lifetime," in Design Automation Conf., San Francisco, California, USA, Jun. 2012.
    • (2012) Design Automation Conf.
    • Jimenez, X.1    Novo, D.2    Ienne, P.3
  • 3
    • 0036564365 scopus 로고    scopus 로고
    • A space-efficient flash translation layer for CompactFlash systems
    • May
    • J. Kim, J. M. Kim, S. H. Noh, S. L. Min, and Y. Cho, "A space-efficient flash translation layer for CompactFlash systems," IEEE Trans. Consumer Electronics, Vol. 48, no. 2, pp. 366-75, May 2002.
    • (2002) IEEE Trans. Consumer Electronics , vol.48 , Issue.2 , pp. 366-375
    • Kim, J.1    Kim, J.M.2    Noh, S.H.3    Min, S.L.4    Cho, Y.5
  • 5
    • 70350332131 scopus 로고    scopus 로고
    • LAST: Locality-aware sector translation for NAND flash memory-based storage systems
    • Oct.
    • S. Lee, D. Shin, Y.-J. Kim, and J. Kim, "LAST: Locality-aware sector translation for NAND flash memory-based storage systems," ACM SIGOPS Operating Systems Review, Vol. 42, no. 6, pp. 36-42, Oct. 2008.
    • (2008) ACM SIGOPS Operating Systems Review , vol.42 , Issue.6 , pp. 36-42
    • Lee, S.1    Shin, D.2    Kim, Y.-J.3    Kim, J.4
  • 6
    • 70350064457 scopus 로고    scopus 로고
    • KAST: K-associative sector translation for NAND flash memory in real-time systems
    • Nice, France, Apr.
    • H. Cho, D. Shin, and Y I. Eom, "KAST: K-associative sector translation for NAND flash memory in real-time systems," in Design Automation and Test in Europe, Nice, France, Apr. 2009, pp. 507-12.
    • (2009) Design Automation and Test in Europe , pp. 507-512
    • Cho, H.1    Shin, D.2    Eom, Y.I.3
  • 7
    • 79955546429 scopus 로고    scopus 로고
    • ROSE: A novel flash translation layer for NAND flash memory based on hybrid address translation
    • Jun.
    • M.-L. Chiao and D.-W. Chang, "ROSE: A novel flash translation layer for NAND flash memory based on hybrid address translation," IEEE Trans. Computers, Vol. 60, no. 6, pp. 753-66, Jun. 2011.
    • (2011) IEEE Trans. Computers , vol.60 , Issue.6 , pp. 753-766
    • Chiao, M.-L.1    Chang, D.-W.2
  • 8
    • 77956247364 scopus 로고    scopus 로고
    • A hybrid approach to NAND-flash-based solid-state disks
    • Oct.
    • L.-P Chang, "A hybrid approach to NAND-flash-based solid-state disks," IEEE Trans. Computers, Vol. 59, no. 10, pp. 1337-49, Oct. 2010.
    • (2010) IEEE Trans. Computers , vol.59 , Issue.10 , pp. 1337-1349
    • Chang, L.-P.1
  • 9
    • 78649510098 scopus 로고    scopus 로고
    • ComboFTL: Improving performance and lifespan of MLC flash memory using SLC flash buffer
    • Dec.
    • S. Im and D. Shin, "ComboFTL: Improving performance and lifespan of MLC flash memory using SLC flash buffer," Journal of Systems Architecture, Vol. 56, no. 12, pp. 641-53, Dec. 2010.
    • (2010) Journal of Systems Architecture , vol.56 , Issue.12 , pp. 641-653
    • Im, S.1    Shin, D.2
  • 10
    • 79551499873 scopus 로고    scopus 로고
    • A hybrid flash translation layer design for SLC-MLC flash memory based multibank solid state disk
    • Feb.
    • J.-W. Park, S.-H. Park, C. C. Weems, and S.-D. Kim, "A hybrid flash translation layer design for SLC-MLC flash memory based multibank solid state disk," Microprocessors & Microsystems, Vol. 35, no. 1, pp. 48-59, Feb. 2011.
    • (2011) Microprocessors & Microsystems , vol.35 , Issue.1 , pp. 48-59
    • Park, J.-W.1    Park, S.-H.2    Weems, C.C.3    Kim, S.-D.4
  • 11
  • 12
  • 13
    • 84862060405 scopus 로고    scopus 로고
    • Extending the lifetime of NAND flash memory by salvaging bad blocks
    • Dresden, Germany, Mar.
    • C. Wang and W.-F. Wong, "Extending the lifetime of NAND flash memory by salvaging bad blocks," in Design Automation and Test in Europe, Dresden, Germany, Mar. 2012, pp. 260-63.
    • (2012) Design Automation and Test in Europe , pp. 260-263
    • Wang, C.1    Wong, W.-F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.