Industrial R&D scrutinized

Chemical and Engineering News

Volumn 75, Issue 38, 1997, Pages 14-15

  Thayer, Ann M ^a  

^a C AND EN   (United States)

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EID: 84885615704     PISSN: 00092347     EISSN: 1520605X     Source Type: Trade Journal    
DOI: 10.1021/cen-v075n038.p014     Document Type: Article

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