Backward-slice-based statistical fault localization without test oracles

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Volumn , Issue , 2013, Pages 212-221

  Lei, Yan ^a   Mao, Xiaoguang ^a   Chen, Tsong Yueh ^b  

^a NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY   (China)

^b SWINBURNE UNIVERSITY OF TECHNOLOGY   (Australia)

Author keywords

backward slice; metamorphic testing; oracle problem; statistical fault localization; test oracle

Indexed keywords

BACKWARD SLICE; FAULT LOCALIZATION; METAMORPHIC TESTING; ORACLE PROBLEM; TEST ORACLES;

TESTING;

EID: 84885578204     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/QSIC.2013.45     Document Type: Conference Paper

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