SCOPUS 정보 검색 플랫폼

Volumn 114, Issue 13, 2013, Pages

Structure-induced negatively skewed X-ray diffraction pattern of carbon onions

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; DIFFRACTION PATTERNS; INTERFEROMETRY; X RAY DIFFRACTION;

ATOMIC DENSITY; CARBON ONIONS; GRADUAL CHANGES; MODEL ANALYSIS; PROFILE BROADENING;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 84885467621 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.4824286 Document Type: Article

Times cited : (3)

References (9)

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