A survey of checker architectures

ACM Computing Surveys

Volumn 45, Issue 4, 2013, Pages

  Kalayappan, Rajshekar ^a   Sarangi, Smruti R ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

Author keywords

Checker architectures; Fault tolerance; Reliability

Indexed keywords

DIFFERENT CLASS; FAULT-DETECTION MECHANISMS; MANUFACTURABILITY; MULTICORE CHIPS; PRIMARY DESIGN;

FAULT DETECTION; FAULT TOLERANCE; RELIABILITY; SURVEYS;

COMPUTER ARCHITECTURE;

EID: 84885228906     PISSN: 03600300     EISSN: 15577341     Source Type: Journal    
DOI: 10.1145/2501654.2501662     Document Type: Article

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