A concept analysis inspired greedy algorithm for test suite minimization

ACM SIGPLAN/SIGSOFT Workshop on Program Analysis for Software Tools and Engineering

Volumn , Issue , 2005, Pages 35-42

  Tallam, Sriraman ^a   Gupta, Neelam ^a  

^a University of Arizona   (United States)

Author keywords

concept analysis; test cases; test suite minimization; testing requirements

Indexed keywords

CONCEPT ANALYSIS; GREEDY ALGORITHMS; SOFTWARE DEVELOPMENT LIFE CYCLE; TEST CASE; TEST SUITE MINIMIZATION; TEST SUITE REDUCTION; TESTING REQUIREMENTS; TIME CONSTRAINTS;

COMPUTER PROGRAMMING LANGUAGES; EXPERIMENTS; HEURISTIC ALGORITHMS; SOFTWARE DESIGN; TESTING;

SOFTWARE TESTING;

EID: 84885212109     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1108792.1108802     Document Type: Conference Paper

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