Evidence for Berezinskii-Kosterlitz-Thouless transition in atomically flat two-dimensional Pb superconducting films

Solid State Communications

Volumn 165, Issue , 2013, Pages 59-63

  Zhao, Weiwei ^a,b,c   Wang, Qingyan ^a,b   Liu, Minhao ^b   Zhang, Wenhao ^a,b   Wang, Yilin ^a   Chen, Mu ^b   Guo, Yang ^a   He, Ke ^a   Chen, Xi ^b   Wang, Yayu ^b   Wang, Jian ^c,d   Xie, Xincheng ^d   Niu, Qian ^d   Wang, Lili ^a   Ma, Xucun ^a   Jain, Jainendra K ^c   Chan, M H W ^c   Xue, Qi Kun ^a,b  

^a INSTITUTE OF PHYSICS   (China)

^b TSINGHUA UNIVERSITY   (China)

^c PENNSYLVANIA STATE UNIVERSITY   (United States)

^d PEKING UNIVERSITY   (China)

Author keywords

BKT transition; Crystalline lead films; Scanning tunneling microscopy; Transport measurement

Indexed keywords

ATOMIC PHYSICS; CRYSTALLINE MATERIALS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON ENERGY ANALYZERS; LEAD; SCANNING TUNNELING MICROSCOPY; THIN FILMS;

BEREZINSKII-KOSTERLITZ-THOULESS TRANSITION; BKT TRANSITION; CURRENT DEPENDENCE; INTEGER NUMBERS; INTERMEDIATE PHASE; KOSTERLITZ-THOULESS; LEAD FILMS; TRANSPORT MEASUREMENTS;

SUPERCONDUCTING FILMS;

EID: 84885118789     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2013.04.025     Document Type: Article

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