SCOPUS 정보 검색 플랫폼

Review of Scientific Instruments

Volumn 84, Issue 9, 2013, Pages

Generalization of the classical xyz-polarization analysis technique to out-of-plane and inelastic scattering

(5) Ehlers, G a Stewart, J R b Wildes, A R c Deen, P P d Andersen, K H d

a OAK RIDGE NATIONAL LABORATORY (United States)

b RUTHERFORD APPLETON LABORATORY (United Kingdom)

c INSTITUT LAUE LANGEVIN (France)

d EUROPEAN SPALLATION SOURCE ERIC (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYSIS TECHNIQUES; BEAM DIVERGENCE; LARGE DETECTORS; MULTI-DETECTORS; NEUTRON POLARIZATION ANALYSIS; OUT-OF-PLANE; POLARIZATION ANALYSIS; TECHNICAL ADVANCES;

DETECTORS; MAGNETIC MATERIALS; NEUTRON DIFFRACTION; POLARIZATION;

INCOHERENT SCATTERING;

EID: 84885093859 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.4819739 Document Type: Article

Times cited : (38)

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