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Volumn 38, Issue 19, 2013, Pages 3878-3881
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Measurements of the refractive indices and thermo-optic coefficients of Si3N4 and SiOx using microring resonances
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROMAGNETIC SIMULATION;
MATERIAL PARAMETER;
MICRORING RESONANCE;
MICRORING RESONATOR;
SINGLE WAVELENGTH;
SINGULAR VALUE DECOMPOSITION METHOD;
TEMPERATURE SENSITIVITY;
THERMO-OPTIC COEFFICIENTS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
RESONANCE;
SILICON NITRIDE;
VAPORS;
REFRACTIVE INDEX;
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EID: 84885032890
PISSN: 01469592
EISSN: 15394794
Source Type: Journal
DOI: 10.1364/OL.38.003878 Document Type: Article |
Times cited : (261)
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References (14)
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