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Volumn 38, Issue 19, 2013, Pages 3878-3881

Measurements of the refractive indices and thermo-optic coefficients of Si3N4 and SiOx using microring resonances

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC SIMULATION; MATERIAL PARAMETER; MICRORING RESONANCE; MICRORING RESONATOR; SINGLE WAVELENGTH; SINGULAR VALUE DECOMPOSITION METHOD; TEMPERATURE SENSITIVITY; THERMO-OPTIC COEFFICIENTS;

EID: 84885032890     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.38.003878     Document Type: Article
Times cited : (261)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.