EHL film thickness behaviour under high pressure - Comparison between numerical and experimental results

Solid Mechanics and its Applications

Volumn 134, Issue , 2006, Pages 217-228

  Hartl, Martin ^a   Křupka, Ivan ^a   Zhu, Dong ^b  

^a BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

^b EATON CORPORATION   (United States)

Author keywords

Central film thickness; High contact pressure; Thin lubricant films

Indexed keywords

CENTRAL FILM THICKNESS; EHL FILM THICKNESS; HIGH CONTACT PRESSURES; LOG LOG SCALE; NUMERICAL SOLUTION; OPTICAL MEASUREMENT; THICKNESS REDUCTION; THIN LUBRICANT FILMS;

ELASTOHYDRODYNAMICS; OPTICAL DATA PROCESSING;

FILM THICKNESS;

EID: 84884895785     PISSN: 09250042     EISSN: None     Source Type: Book Series    
DOI: 10.1007/1-4020-4533-6_15     Document Type: Conference Paper

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