Forensic analysis of glass by μ-XRF, SN-ICP-MS, LA-ICP-MS and LA-ICP-OES: Evaluation of the performance of different criteria for comparing elemental composition

Journal of Analytical Atomic Spectrometry

Volumn 28, Issue 8, 2013, Pages 1270-1282

  Trejos, Tatiana ^a   Koons, Robert ^b   Weis, Peter ^c   Becker, Stefan ^c   Berman, Ted ^d   Dalpe, Claude ^e   Duecking, Marc ^c   Buscaglia, Joann ^b   Eckert Lumsdon, Tiffany ^f   Ernst, Troy ^g   Hanlon, Christopher ^h   Heydon, Alex ⁱ   Mooney, Kim ^f   Nelson, Randall ^j   Olsson, Kristine ^k   Schenk, Emily ^a   Palenik, Christopher ^l   Pollock, Edward Chip ^m   Rudell, David ⁱ   Ryland, Scott ^d   Tarifa, Anamary ^a   Valadez, Melissa ⁿ   Van Es, Andrew ^o   Zdanowicz, Vincent ^p   Almirall, Jose ^a   more..

^a FLORIDA INTERNATIONAL UNIVERSITY   (United States)

^b Federal Bureau of Investigation   (United States)

^c BKA Bundeskriminalamt   (Germany)

^d Florida Department of Law Enforcement   (United States)

^e ROYAL CANADIAN MOUNTED POLICE   (Canada)

^f US Army Investigation Laboratory   (United States)

^g Michigan State Police Crime Laboratory   (United States)

^h Forensic Science Services Bureau   (United States)

ⁱ Center of Forensic Sciences   (Canada)

^j Forensic Services Division   (United States)

^k Johnson County Crime Laboratory   (United States)

^l Microtrace   (United States)

^m Laboratory of Forensic Services   (United States)

ⁿ Texas Department of Public Safety Crime Laboratory   (United States)

^o NETHERLANDS FORENSIC INSTITUTE   (Netherlands)

^p US Customs Service   (United States)

more..

Author keywords

[No Author keywords available]

Indexed keywords

GLASS; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; MASS SPECTROMETERS;

CONFIDENCE INTERVAL; ELEMENTAL COMPOSITIONS; FORENSIC ANALYSIS; INTERLABORATORY TESTS; MANUFACTURING PLANT; RELATIVE STANDARD DEVIATIONS; SENSITIVE METHOD; SPECTRAL OVERLAY;

GLASS PLANTS;

EID: 84884880133     PISSN: 02679477     EISSN: 13645544     Source Type: Journal    
DOI: 10.1039/c3ja50128k     Document Type: Article

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