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Volumn , Issue , 2011, Pages 431-434
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An optical streaking method for measuring femtosecond electron bunches
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON BUNCH LENGTHS;
FEMTO-SECOND ELECTRON BUNCH;
FEMTOSECOND TIME SCALE;
LASER-ELECTRON INTERACTION;
LINAC COHERENT LIGHT SOURCE;
LONGITUDINAL PROFILE;
SINGLE-SHOT MEASUREMENTS;
X-RAY FREE ELECTRON LASERS;
ELECTRON BEAM LITHOGRAPHY;
FREE ELECTRON LASERS;
LIGHT SOURCES;
PARTICLE BEAM BUNCHING;
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EID: 84884658247
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (8)
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