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Volumn 52, Issue 1, 2014, Pages 230-240

Advanced processing of optical fringe patterns by automated selective reconstruction and enhanced fast empirical mode decomposition

Author keywords

DSPI; Empirical mode decomposition; Fringe analysis; Interferometry; Structured illumination shape measurement

Indexed keywords

BI-DIMENSIONAL EMPIRICAL MODE DECOMPOSITIONS; CALCULATION TIME REDUCTION; DSPI; EMPIRICAL MODE DECOMPOSITION; FRINGE ANALYSIS; FRINGE PATTERN PROCESSING; SELECTIVE RECONSTRUCTION; SHAPE MEASUREMENTS;

EID: 84884500104     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlaseng.2013.06.003     Document Type: Article
Times cited : (124)

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