메뉴 건너뛰기




Volumn , Issue , 2009, Pages 251-254

Recent emittance measurement results for the upgraded PITZ facility

Author keywords

[No Author keywords available]

Indexed keywords

EMITTANCE MEASUREMENT; EMITTANCES; EUROPEAN XFEL; HIGH BRIGHTNESS; MEASUREMENT PROGRAMS; PHOTO-INJECTOR TEST; PHOTOCATHODE LASER; TEMPORAL DISTRIBUTION;

EID: 84884405425     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (7)
  • 2
    • 84884366168 scopus 로고    scopus 로고
    • Detailed characterization of electron sources at PITZ yielding first demonstration of european X-ray free-electron laser beam quality
    • submitted to
    • F. Stephan, C.H. Boulware, M. Krasilnikov, J. Bahr et al., "Detailed characterization of electron sources at PITZ yielding first demonstration of European X-ray Free-Electron Laser beam quality", submitted to PRST-AB.
    • PRST-AB
    • Stephan, F.1    Boulware, C.H.2    Krasilnikov, M.3    Bahr, J.4
  • 5
    • 52049083184 scopus 로고    scopus 로고
    • Generation of flat-top picosecond pulses by coherent pulse stacking in a multicrystal birefrin-gent filter
    • I. Will and G. Klemz, "Generation of flat-top picosecond pulses by coherent pulse stacking in a multicrystal birefrin-gent filter", Optics Express, Vol. 16, No. 9 (2008) 14922-14937.
    • (2008) Optics Express , vol.16 , Issue.9 , pp. 14922-14937
    • Will, I.1    Klemz, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.