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Journal of Non-Crystalline Solids

Volumn 377, Issue , 2013, Pages 195-199

Gamma ray induced structural effects in bare and Ag doped Ge-S thin films for sensor application

(7) Mitkova, M a,d Chen, P a Ailavajhala, M a Butt, D P a,d Tenne, D A b Barnaby, H c Esqueda, I S c

a Boise State University (United States)

b BOISE STATE UNIVERSITY (United States)

c AZ 85281 (United States)

d UNIVERSITY OF IDAHO (United States)

Author keywords

Chalcogenide glasses; Radiation effects; Radiation induced ag diffusion; Radiation sensing

Indexed keywords

CHALCOGENIDES; DIFFUSION; GAMMA RAYS; GERMANIUM; GLASS; RADIATION; SILVER; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

AG DIFFUSION; CHALCOGENIDE GLASS; ENERGY DISPERSIONS; RADIATION-INDUCED EFFECTS; RADIATION-SENSING; SENSOR APPLICATIONS; STRUCTURAL DEVELOPMENT; STRUCTURAL REORGANIZATION;

RADIATION EFFECTS;

EID: 84884291150 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2012.12.031 Document Type: Article

Times cited : (11)

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