Remote phonon and impurity screening effect of substrate and gate dielectric on electron dynamics in single layer MoS2

Applied Physics Letters

Volumn 103, Issue 11, 2013, Pages

  Zeng, Lang ^a   Xin, Zheng ^a   Chen, Shaowen ^a   Du, Gang ^a   Kang, Jinfeng ^a   Liu, Xiaoyan ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED IMPURITY; DEVICE PERFORMANCE; ELECTRON DYNAMICS; IMPURITY SCREENING; INTERFACIAL LAYER; MOBILITY CURVES; TEMPERATURE DEPENDENT; TRANSISTOR STRUCTURE;

DYNAMICS; GATE DIELECTRICS; HAFNIUM OXIDES; MOLYBDENUM COMPOUNDS; MONTE CARLO METHODS; PHONONS;

SUBSTRATES;

EID: 84884223228     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4821344     Document Type: Article

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