Noise-resistant local binary pattern with an embedded error-correction mechanism

IEEE Transactions on Image Processing

Volumn 22, Issue 10, 2013, Pages 4049-4060

  Ren, Jianfeng ^a   Jiang, Xudong ^b   Yuan, Junsong ^b  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Local binary pattern; local ternary pattern; noise resistance; uniform patterns

Indexed keywords

CORRUPTED IMAGES; DISTORTED IMAGES; LOCAL BINARY PATTERNS; LOCAL STRUCTURE; LOCAL TERNARY PATTERNS; LOCAL TERNARY PATTERNS (LTP); NOISE RESISTANCE; UNIFORM PATTERNS;

IMAGE PROCESSING; MATHEMATICAL MODELS;

PATTERN RECOGNITION;

EID: 84884220791     PISSN: 10577149     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIP.2013.2268976     Document Type: Article

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