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Volumn 150, Issue 1, 2013, Pages 185-196

A new Integrated Negative Symptom structure of the Positive and Negative Syndrome Scale (PANSS) in schizophrenia using item response analysis

Author keywords

Item response analysis; Negative symptoms; PANSS

Indexed keywords

ANALYTIC METHOD; ARTICLE; BLUNTED AFFECT; COGNITIVE DEFECT; CONTROLLED STUDY; DISEASE SEVERITY; EMOTIONAL DISORDER; HUMAN; ITEM RESPONSE THEORY; NEGATIVE SYNDROME; POSITIVE AND NEGATIVE SYNDROME SCALE; PRINCIPAL COMPONENT ANALYSIS; PRIORITY JOURNAL; PSYCHOLOGIC ASSESSMENT; PSYCHOLOGICAL RATING SCALE; PSYCHOSOCIAL WITHDRAWAL; SCHIZOPHRENIA; SCORING SYSTEM; SOCIAL AVOIDANCE BEHAVIOR; STEREOTYPY;

EID: 84884156653     PISSN: 09209964     EISSN: 15732509     Source Type: Journal    
DOI: 10.1016/j.schres.2013.07.007     Document Type: Article
Times cited : (17)

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