A comprehensive framework for skin model simulation

ASME 2012 11th Biennial Conference on Engineering Systems Design and Analysis, ESDA 2012

Volumn 3, Issue , 2012, Pages 567-576

  Schleich, Benjamin ^a   Walter, Michael ^a   Wartzack, Sandro ^a   Anwer, Nabil ^b   Mathieu, Luc ^b  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

Geometric deviations; GPS; Random fields; Skin model simulation

Indexed keywords

GEOMETRIC DEVIATIONS; GEOMETRICAL ANALYSIS; GEOMETRICAL VARIATIONS; MANUFACTURING PROCESS SIMULATIONS; MEASUREMENT UNCERTAINTY; PRODUCT DEVELOPMENT PROCESS; RANDOM FIELDS; SKIN MODEL;

GEOMETRY; GLOBAL POSITIONING SYSTEM; INDUSTRIAL ENGINEERING; INFORMATION MANAGEMENT; MANUFACTURE; PRODUCT DEVELOPMENT; PRODUCTION ENGINEERING; SYSTEMS ANALYSIS; UNCERTAINTY ANALYSIS;

COMPUTER SIMULATION;

EID: 84883895351     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/ESDA2012-82204     Document Type: Conference Paper

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