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Volumn , Issue , 2008, Pages 62-65

On the use of a reliable low-cost set-up for characterization measurements of antennas

Author keywords

Antenna characterization; Frequency domain analysis; Scattering parameter; Time domain reflectometry

Indexed keywords

ANTENNA CHARACTERISTICS; ANTENNA CHARACTERIZATIONS; ANTENNA MEASUREMENT; CHARACTERIZATION MEASUREMENT; FREQUENCY DOMAINS; RELIABLE RESULTS; TIME DOMAIN REFLECTOMETRY; TIME-DOMAIN DATA;

EID: 84883640277     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (8)
  • 4
    • 84883642144 scopus 로고    scopus 로고
    • Correlation between VNA and TDR/TDT extracted S-Parameters up to 20 GHz
    • [Online], Available
    • C. Wakayama and J. Loyer, "Correlation between VNA and TDR/TDT extracted S-Parameters up to 20 GHz", Intel Corporation/University of Washington (White paper) (2005) [Online]. Available: http://www.tek.com/ products/oscilloscopes/sampling/interconnect-analysis/customer-papers/.
    • (2005) Intel Corporation/University of Washington (White Paper)
    • Wakayama, C.1    Loyer, J.2
  • 7
    • 34247247705 scopus 로고    scopus 로고
    • A frequency-domain method for extending TDR performance in quality determination of fluids
    • A. Cataldo, L. Catarinucci, L. Tarricone, F. Attivissimo, and A. Trotta, "A frequency-domain method for extending TDR performance in quality determination of fluids", Meas. Sci. Technol., vol. 18, pp. 675-688, 2007.
    • (2007) Meas. Sci. Technol. , vol.18 , pp. 675-688
    • Cataldo, A.1    Catarinucci, L.2    Tarricone, L.3    Attivissimo, F.4    Trotta, A.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.