Non destructive testing of Friction Stir Welding: Comparison of planar eddy current probes

16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc.

Volumn , Issue , 2008, Pages 507-512

  Dos Santos, Telmo Gomes ^a   Ramos, Pedro M ^b   Dos Santos Vilaça, Pedro ^a  

^a UNIVERSITY OF LISBON   (Portugal)

^b INSTITUTO SUPERIOR TÉCNICO   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

COMPARISON RESULT; EDDY CURRENT PROBES; FRICTION STIR WELDING(FSW); FSW JOINT; IMPEDANCE MEASUREMENT; NON DESTRUCTIVE TESTING; STANDARD CONDITIONS; WELDED STRUCTURES;

DEFECTS; FRICTION STIR WELDING; INDUSTRIAL APPLICATIONS; PROBES; QUALITY ASSURANCE; WELDING;

NONDESTRUCTIVE EXAMINATION;

EID: 84883610667     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. Pedro Vilaça, Telmo Santos, Luisa Quintino, "Experimental analysis, defect evaluation and computational developments of FSW", Proceeding of IIW South East, Romania, 2006.
2. Telmo Santos, Bruno Silva, Pedro Vilaça, João Sousa, Luísa Quintino, "Fusão de dados em ensaios não destrutivos utilizando decisão fuzzy para a avaliação de soldas obtidas pelo processo de fricção linear", Soldagem e Inspecção, vol. 12, n. 3, pp. 179-187, 2007 (in portuguese).
3. R. Ditchburn, S. Burke, "Planar rectangular spiral coils in eddy-current nondestructive Inspection", NDT&E International, vol. 38, n. 8, pp. 690-700, 2005.
4. Agilent 4294A Precision Impedance Analyzer, Operation Manual and Programming Manual, Agilent Technologies.
5. H. Renders, J. Schoukens, G. Vilain, "High-accuracy spectrum analysis of sampled discrete frequency signals by analytical leakage compensation, " IEEE Trans. Instr. Meas., vol. 33, no. 4, pp. 287-292, Dec 1984.
6. Pedro M. Ramos and A. Cruz Serra, "A new sine-fitting algorithm for accurate amplitude and phase measurements in two channel acquisition systems", Measurement, Elsevier, Vol. 41, No. 2, pp. 135-143, Feb. 2008.