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Volumn 5, Issue 9, 2013, Pages 2543-2545
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Special issue: Advanced electron microscopy for catalysis
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Author keywords
EELS; Electron microscopy; HAADF; Heterogeneous catalysis; Holography; SEM; STEM; TEM; Tomography
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Indexed keywords
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EID: 84883526558
PISSN: 18673880
EISSN: 18673899
Source Type: Journal
DOI: 10.1002/cctc.201300657 Document Type: Editorial |
Times cited : (4)
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References (3)
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