A novel high performance WOx ReRAM based on thermally-induced SET operation

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2013, Pages

  Chien, Wei Chih ^a   Lee, Ming Hsm ^a   Lee, Feng Ming ^a   Chen, Wei Chen ^a   Lee, Dai Ying ^a   Lin, Yu Yu ^a   Lai, Erh Kun ^a   Lung, Hsiang Lan ^a   Hsieh, Kuang Yeu ^a   Lu, Chih Yuan ^a  

^a MACRONIX INTERNATIONAL CO LTD   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE DEGRADATION; DEVICE PERFORMANCE; HIGH CURRENTS; HIGH-CURRENT STRESSING; LARGE CURRENT; SET OPERATION; THERMALLY INDUCED; UNIPOLAR OPERATION;

EID: 84883413908     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. M.J. Kim, et al., IEDMTech. Dig., pp. 444-447, 2010.
2. W.C.Chi en et al., IEEE Electron Device Letter, pp. 126-128, 2010.
3. W.C.Chi en et al., IEDM Tech. Dig., pp. 725-728, 2011.