Modeling RRAM set/reset statistics resulting in guidelines for optimized operation

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2013, Pages

  Degraeve, R ^a   Fantini, A ^a   Raghavan, N ^b   Chen, Y Y ^b   Goux, L ^a   Clima, S ^a   Cosemans, S ^a   Govoreanu, B ^a   Wouters, D J ^b   Roussel, Ph ^a   Kar, G S ^a   Groeseneken, G ^b   Jurczak, M ^a  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

OPTIMIZED OPERATIONS; STATISTICAL PROPERTIES; STOCHASTIC NATURE;

EID: 84883382829     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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7. A. Fantini et al., IMW 2012.
8. Y.Y. Chen et al., IEDM 2012
9. N. Ramaswamy, IIRW 2012.