Experimental analysis and modeling of self heating effect in dielectric isolated planar and fin devices

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2013, Pages

  Lee, S ^a   Wachnik, R ^a   Hyde, P ^a   Wagner, L ^a   Johnson, J ^a,a   Chou, A ^a   Kumar, A ^a   Narasimha, S ^a   Standaert, T ^a   Greene, B ^a   Yamashita, T ^a   Balakrishnan, K ^a   Bu, H ^a   Springer, S ^a   Freeman, G ^a   Henson, W ^a   Nowak, E ^a  

^a IBM RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERISTIC TIME; DEVICE CHARACTERISTICS; DIELECTRIC ISOLATION; DRAIN JUNCTIONS; EXPERIMENTAL ANALYSIS; OPERATING FREQUENCY; QUANTITATIVE COMPARISON; SELF-HEATING EFFECT;

DIELECTRIC DEVICES; FIELD EFFECT TRANSISTORS; INTEGRATED CIRCUITS;

HEATING;

EID: 84883351629     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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