Multispectral imaging with vertical silicon nanowires

Scientific Reports

Volumn 3, Issue , 2013, Pages

  Park, Hyunsung ^a   Crozier, Kenneth B ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NANOWIRE; SILICON;

CHEMISTRY; COLORIMETRY; DEVICE FAILURE ANALYSIS; DEVICES; EQUIPMENT DESIGN; IMAGE ENHANCEMENT; NANOTECHNOLOGY; NEAR INFRARED SPECTROSCOPY; ULTRASTRUCTURE; ARTICLE; EQUIPMENT; EQUIPMENT FAILURE;

COLORIMETRY; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; NANOTECHNOLOGY; NANOWIRES; SILICON; SPECTROSCOPY, NEAR-INFRARED;

EID: 84883105488     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep02460     Document Type: Article

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