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Volumn , Issue , 2012, Pages 313-322

A laser scanner chip set for accurate perception systems

Author keywords

LIDAR; Minifaros; Optical distance measurement; Time interval measurement; Timing discrimination

Indexed keywords

AUTOMOTIVE APPLICATIONS; CMOS TECHNOLOGY; INTEGRATED RECEIVERS; MINIFAROS; OPTICAL DISTANCE MEASUREMENTS; PERCEPTION SYSTEMS; TIME INTERVAL MEASUREMENTS; TIMING DISCRIMINATION;

EID: 84882939759     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/978-3-642-29673-4_29     Document Type: Conference Paper
Times cited : (2)

References (4)
  • 1
    • 78650041341 scopus 로고    scopus 로고
    • An integrated laser radar receiver channel utilizing a time-domain walk error compensation scheme
    • S. Kurtti, J. Kostamovaara, An integrated laser radar receiver channel utilizing a time-domain walk error compensation scheme, IEEE Transactions on Instrumentation and Measurement, vol. 30, no. 1, pp. 146-157, 2011.
    • (2011) IEEE Transactions on Instrumentation and Measurement , vol.30 , Issue.1 , pp. 146-157
    • Kurtti, S.1    Kostamovaara, J.2
  • 2
    • 20444479155 scopus 로고    scopus 로고
    • A 250- MHz BiCMOS receiver channel with leading edge timing discrimination
    • P. Palojarvi, T. Ruotsalainen, J. Kostamovaara, A 250-MHz BiCMOS receiver channel with leading edge timing discrimination, IEEE Journal of Solid-State Circuits, vol. 40, no. 6, pp. 1341-1349, 2005.
    • (2005) IEEE Journal of Solid-State Circuits , vol.40 , Issue.6 , pp. 1341-1349
    • Palojarvi, P.1    Ruotsalainen, T.2    Kostamovaara, J.3
  • 3
    • 66149164594 scopus 로고    scopus 로고
    • Integrated receiver including both receiver channel and tdc for a pulsed time-of-flight laser rangefinder with cmlevel accuracy
    • May
    • J. Nissinen, I Nissinen., J. Kostamovaara, Integrated receiver including both receiver channel and TDC for a pulsed time-of-flight laser rangefinder with cmlevel accuracy, IEEE Solid-State Circuits, vol. 44, no. 5, pp. 1486-1497, May 2009.
    • (2009) IEEE Solid-State Circuits , vol.44 , Issue.5 , pp. 1486-1497
    • Nissinen, J.1    Nissinen, I.2    Kostamovaara, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.