DFT study of the interactions of Cl- with passivated Nickel surfaces: Energetic and structural aspects

Passivation of Metals and Semiconductors, and Properties of Thin Oxide Layers

Volumn , Issue , 2006, Pages 659-665

  Diawara, B ^a   Bouzoubaa, A ^a   Pineau, N ^b   Minot, C ^b   Maurice, V ^a   Marcus, P ^a  

^a CNRS   (France)

^b LABORATOIRE DE CHIMIE THÉORIQUE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84882881654     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1016/B978-044452224-5/50101-3     Document Type: Chapter

References (10)

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6. MonKhorst H.J., Pack J.D. Phys Rev. B 1976, 13:5188.
7. Maurice V., Tallah H., Marcus P. Surface Sci 1994, 304:98.
8. Zuili D., Maurice V., Marcus P. J.Phys.Chem. 2000, 147:1393.
9. Maurice V., Klein L., Marcus P. ELectrochem.Sol.StateLett. 2001, 4:B1.
10. Antoci S., Mihich L. Phys Rev. B 1978, 18:5768.