IEC61850-based systems - Functional testing and interoperability issues

IEEE Transactions on Industrial Informatics

Volumn 9, Issue 3, 2013, Pages 1436-1444

  Manassero, Giovanni ^a   Pellini, Eduardo Lorenzetti ^a   Senger, Eduardo Cesar ^a   Nakagomi, Renato Mikio ^b  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

^b TUFTS UNIVERSITY   (United States)

Author keywords

Functional testing; IEC 61850; power system protection; substation automation

Indexed keywords

AUTOMATION SYSTEMS; FUNCTIONAL TESTING; HARDWARE AND SOFTWARE; IEC 61850; IEC61850 STANDARD; INTELLIGENT ELECTRONIC DEVICE; POWER SYSTEM PROTECTION; SUBSTATION AUTOMATION;

AUTOMATION; ELECTRIC SUBSTATIONS; STANDARDS; SURGE PROTECTION;

INTEROPERABILITY;

EID: 84882764428     PISSN: 15513203     EISSN: None     Source Type: Journal    
DOI: 10.1109/TII.2012.2217977     Document Type: Article

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