Electronic test solutions for FlowFET fluidic arrays

DTIP 2003 - Design, Test, Integration and Packaging of MEMS/MOEMS 2003

Volumn , Issue , 2003, Pages 27-32

  Kerkhoff, H G ^a   Acar, M ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Chemical analysis; Circuit faults; Control system synthesis; Electrical fault detection; Electronic equipment testing; Etching; Fluid flow control; Manufacturing; Silicon; Voltage

Indexed keywords

EID: 84882498750     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DTIP.2003.1287003     Document Type: Conference Paper

References (12)

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