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Applied Physics Letters

Volumn 103, Issue 5, 2013, Pages

Single-shot measurement of a terahertz electric-field waveform using a reflective echelon mirror

(4) Minami, Yasuo a Hayashi, Yusuke a Takeda, Jun a Katayama, Ikufumi a

a YOKOHAMA NATIONAL UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEMENTARY METAL OXIDE SEMICONDUCTORS; ELECTRIC FIELD WAVEFORM; ELECTROOPTIC EFFECTS; FIELD STRENGTHS; POLARIZATION ROTATION; PROBE PULSE; SINGLE-SHOT; SINGLE-SHOT MEASUREMENTS;

ELECTRIC FIELDS; PROBES;

MIRRORS;

EID: 84882321201 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4817011 Document Type: Article

Times cited : (76)

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