Additional enhancement of electric field in surface-enhanced raman scattering due to fresnel mechanism

Scientific Reports

Volumn 3, Issue , 2013, Pages

  Jayawardhana, Sasani ^a   Rosa, Lorenzo ^a   Juodkazis, Saulius ^a,b   Stoddart, Paul R ^a  

^a SWINBURNE UNIVERSITY OF TECHNOLOGY   (Australia)

^b MELBOURNE CENTRE FOR NANOFABRICATION   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL MEMBRANE; METAL NANOPARTICLE;

ARTIFICIAL MEMBRANE; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; PROCEDURES; RADIATION RESPONSE; RAMAN SPECTROMETRY; REFRACTOMETRY; SURFACE PROPERTY; ULTRASTRUCTURE; ARTICLE; METHODOLOGY; RADIATION EXPOSURE;

COMPUTER SIMULATION; MEMBRANES, ARTIFICIAL; METAL NANOPARTICLES; MODELS, CHEMICAL; REFRACTOMETRY; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES;

EID: 84881408107     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep02335     Document Type: Article

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