Lifetime evaluation of IGBT power modules applying a nonlinear saturation voltage observer

2012 7th International Conference on Integrated Power Electronics Systems, CIPS 2012

Volumn , Issue , 2012, Pages

  Wagenitz, Dennis ^a   Hambrecht, Andreas ^a   Dieckerhoff, Sibylle ^b  

^a BEUTH UNIVERSITY OF APPLIED SCIENCES   (Germany)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE TEMPERATURE; LARGE AMOUNTS; LIFETIME EVALUATION; NONLINEAR SATURATION; ON-LINE MEASUREMENT; RAINFLOW ALGORITHMS; TEMPERATURE DEPENDENT; THERMAL IMPEDANCE;

CONDITION MONITORING; ELECTRIC POWER SYSTEMS; TEMPERATURE MEASUREMENT;

DATA COMPRESSION;

EID: 84881117570     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. Wagenitz, D., Westerholz, A., Erdmann, E., Hambrecht, A., Dieckerhoff, S.: Power Cycling Test Bench for IGBT Power Modules used in Wind Applications, Proc. of the EPE, 2011
2. Bayerer, R., Herrmann, T., Licht, T., Lutz, J., Feller, M.: Model for Power Cycling Lifetime of IGBT Modules-Various Factors Influencing Lifetime, Proc. of CIPS, Nürnberg, 2008
3. Franke, U., Krummer, R., Reimann, T., Petzoldt, J., Lorenz, L.: Online Monitoring of Power Devices Junction Temperature in Power Converters using a 32-Bit Microcontroller, Proc. of the IEEE ICIT, 2003
4. Yong-Seok K., Seung-Ki, S.: On-line estimation of IGBT junction temperature using on-state voltage drop, Industry Applications Conference, 1998
5. Wernicke, T., Middendorf, A., Dieckerhoff, S., Guttowski, S., Reichl, H.: Test System for the Reliability Management of Power Modules, Proc. of the CIPS, Nürnberg, 2008
6. Radaj, D., Vormwald, M.: Ermüdungsfestigkeit, Springer Verlag, 2007 (in German)