Fault-model-based test generation for embedded software

IJCAI International Joint Conference on Artificial Intelligence

Volumn , Issue , 2007, Pages 342-347

  Esser, M ^a   Struss, P ^a,b  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b OCC'M Software ^*  (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONTROL SOFTWARE; EMBEDDED SOFTWARE SYSTEMS; PHYSICAL SYSTEMS; RELATIONAL BEHAVIORS; RELATIONAL MODEL; TEST GENERATION ALGORITHM; TEST GENERATIONS; VEHICLE CONTROL;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; CONTROL SYSTEM SYNTHESIS; EMBEDDED SOFTWARE; FINITE AUTOMATA; MODELS; SAFETY TESTING;

SOFTWARE TESTING;

EID: 84880895130     PISSN: 10450823     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. Esser, M: Modellbasierte Generierung von Tests für eingebettete Systeme am Beispiel der Tankanzeige in einem Kraftwagen, Technical University of Munich, 2005
2. Beizer, B.: Black-Box Testing, John Wiley and Sons, New York, NY, 1995
3. Sampath, M., Senupta, R., Lafortune, S., Sinnamohideen, K., Teneketzis, D.: Failure Diagnosis using Discrete Event Models. In: IEEE Transactions on Control Systems Technology, 4(2) 1996, pp. 105-124 (Pubitemid 126782836)
4. Struss, P.: Testing Physical Systems. In: Proceedings of AAAI-94, Seattle, USA, 1994.
5. Struss, P.: Model-based Optimization of Testing through Reduction of Stimuli. 20th International Joint Conference on Artificial Intelligence IJCAI07, Hyderabad, India, 2007