Capillary condensation in mesoporous silica with surface roughness

Adsorption

Volumn 19, Issue 2-4, 2013, Pages 631-641

  Tanaka, Hideki ^a   Hiratsuka, Tatsumasa ^a   Nishiyama, Natsumi ^a   Mori, Kengo ^a   Miyahara, Minoru T ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

Capillary condensation; Electron density profile; MCM 41; Molecular simulation; Surface roughness

Indexed keywords

CONDENSATION; DESORPTION; ELECTRON DENSITY MEASUREMENT; PORE STRUCTURE; SILICA;

CAPILLARY CONDENSATION; CAPILLARY EVAPORATION; CYLINDRICAL PORES; ELECTRON DENSITY PROFILES; MOLECULAR SIMULATIONS; TEMPLATED MESOPOROUS SILICAS; THERMODYNAMIC EQUILIBRIA; X-RAY DIFFRACTION DATA;

SURFACE ROUGHNESS;

EID: 84880703218     PISSN: 09295607     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10450-013-9486-7     Document Type: Conference Paper

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