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Volumn 25, Issue 8, 2013, Pages 426-434

Exposure assessment of workers in printed electronics workplace

Author keywords

Conductive nanoparticles; Exposure assessment; Printed electronics; Printing; Silver nanoparticles

Indexed keywords

2 PROPANOL; ACETIC ACID ETHYL ESTER; ACETONE; BENZENE DERIVATIVE; CARBON NANOTUBE; DICHLOROBENZENE; DICHLOROMETHANE; HEXANE; SILVER NANOPARTICLE; UNCLASSIFIED DRUG; XYLENE;

EID: 84880534886     PISSN: 08958378     EISSN: 10917691     Source Type: Journal    
DOI: 10.3109/08958378.2013.800617     Document Type: Article
Times cited : (22)

References (13)
  • 1
    • 0025163922 scopus 로고
    • Environmental and workplace contamination in the semiconductor industry: Implications for future health of the workforce and community
    • Edelman P. (1990). Environmental and workplace contamination in the semiconductor industry: Implications for future health of the workforce and community. Environ Health Perspect 86:291-5
    • (1990) Environ Health Perspect , vol.86 , pp. 291-295
    • Edelman, P.1
  • 2
    • 84880564623 scopus 로고    scopus 로고
    • EE Times Available from Last accessed: 5 Feb 2013
    • EE Times. (2012). Analyst: Printed electronics is a $9-billion opportunity. Available from: Http://www.eetimes.com/electronics-news/ 4237763/Printed-electronics-opportunity [Last accessed: 5 Feb 2013
    • (2012) Analyst: Printed Electronics Is A $9-Billion Opportunity
  • 3
    • 45849111073 scopus 로고    scopus 로고
    • Monitoring multiwalled carbon nanotube exposure in carbon nanotube research facility
    • Han JH, Lee EJ, Lee JH, et al. (2008). Monitoring multiwalled carbon nanotube exposure in carbon nanotube research facility. Inhal Toxicol 20:741-9
    • (2008) Inhal Toxicol , vol.20 , pp. 741-749
    • Han, J.H.1    Lee, E.J.2    Lee, J.H.3
  • 5
    • 84856879333 scopus 로고    scopus 로고
    • Cases series of malignant lymphohematopoietic disorder in Korean semiconductor industry
    • Kim EA, Lee HE, Ryu HW, et al. (2011). Cases series of malignant lymphohematopoietic disorder in Korean semiconductor industry. Safe Health Work 2:122-34
    • (2011) Safe Health Work , vol.2 , pp. 122-134
    • Kim, E.A.1    Lee, H.E.2    Ryu, H.W.3
  • 7
    • 36448965935 scopus 로고    scopus 로고
    • Cancer and reproductive risks in the semiconductor industry
    • LaDou J, Bailer 3rd JC. (2007). Cancer and reproductive risks in the semiconductor industry. Int J Occup Environ Health 13:376-85
    • (2007) Int J Occup Environ Health , vol.13 , pp. 376-385
    • LaDou, J.1    Bailer III, J.C.2
  • 8
    • 77949546462 scopus 로고    scopus 로고
    • Exposure assessment of carbon nanotube manufacturing workplaces
    • Lee JH, Lee SB, Bae GN, et al. (2011). Exposure assessment of carbon nanotube manufacturing workplaces. Inhal Toxicol 22:369-81
    • (2011) Inhal Toxicol , vol.22 , pp. 369-381
    • Lee, J.H.1    Lee, S.B.2    Bae, G.N.3
  • 9
    • 0003467553 scopus 로고    scopus 로고
    • NIOSH manual of analytical methods
    • National Institute for Occupational Safety and Health (NIOSH
    • National Institute for Occupational Safety and Health (NIOSH). (1999). NIOSH manual of analytical methods. Methods 7402; 5523
    • (1999) Methods , vol.7402 , pp. 5523
  • 10
    • 4644236485 scopus 로고    scopus 로고
    • Cincinnati OH: NIOSH. National Institute for Occupational Safety and Health (NIOSH Methods 7300. Cincinnati OH: NIOSH
    • Cincinnati, OH: NIOSH. National Institute for Occupational Safety and Health (NIOSH). (2003). NIOSH manual of analytical methods. Methods 7300. Cincinnati, OH: NIOSH
    • (2003) NIOSH Manual Of Analytical Methods
  • 11
    • 84880531749 scopus 로고    scopus 로고
    • ObservatoryNano. Available from Last accessed: 5 Feb 2013
    • ObservatoryNano. (2010). ICT sector focus report: Printed electronics. Available from: Http://www.observatorynano.eu/project/ [Last accessed: 5 Feb 2013
    • (2010) ICT Sector Focus Report: Printed Electronics
  • 12
    • 0007525761 scopus 로고    scopus 로고
    • OSHA 27 CFR 1910. 1000. Available from Last accessed: 20 Jan 2013
    • OSHA (Occupational Safety and Health Administration). (2013). 27 CFR 1910.1000. Available from: Http://www.osha.gov/pls/oshaweb/owadisp.show- document?p-id9991&p-tableSTANDARDS [Last accessed: 20 Jan 2013
    • (2013) Occupational Safety and Health Administration
  • 13
    • 84879010443 scopus 로고    scopus 로고
    • Quantitative exposure assessment of various chemical substances in a wafer fabrication industry facility
    • Park H, Jang JK, Shin JA. (2011). Quantitative exposure assessment of various chemical substances in a wafer fabrication industry facility. Safe Health Work 2:39-51
    • (2011) Safe Health Work , vol.2 , pp. 39-51
    • Park, H.1    Jang, J.K.2    Shin, J.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.