How good is your tag?: RFID backscatter metrics and measurements

IEEE Microwave Magazine

Volumn 14, Issue 5, 2013, Pages 47-55

  Kuester, Daniel ^a   Popovic, Zoya ^b  

^a Phase IV Engineering   (United States)

^b UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FUTURE CHALLENGES; LARGE CUSTOMER; PASSIVE UHF RFID; PERFORMANCE METRICS; RF PERFORMANCE; STATE OF THE ART; TEST STANDARDS; ULTRA-HIGH-FREQUENCY;

RADIO FREQUENCY IDENTIFICATION (RFID); TESTING;

BACKSCATTERING;

EID: 84880531943     PISSN: 15273342     EISSN: None     Source Type: Journal    
DOI: 10.1109/MMM.2013.2259394     Document Type: Article

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