Validation of three-dimensional diffraction contrast tomography reconstructions by means of electron backscatter diffraction characterization

Journal of Applied Crystallography

Volumn 46, Issue 4, 2013, Pages 1145-1150

  Syha, Melanie ^a   Trenkle, Andreas ^a   Lödermann, Barbara ^a   Graff, Andreas ^b   Ludwig, Wolfgang ^c   Weygand, Daniel ^a   Gumbsch, Peter ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b FRAUNHOFER INSTITUTE FOR MECHANICS OF MATERIALS IWM   (Germany)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

diffraction contrast tomography; electron backscatter diffraction; microstructure characterization

Indexed keywords

CHARACTERIZATION METHODS; CRYSTALLOGRAPHIC ORIENTATIONS; DIFFRACTION CONTRAST; ELECTRON BACK SCATTER DIFFRACTION; MICROSTRUCTURE CHARACTERIZATION; MICROSTRUCTURE RECONSTRUCTION; THREE-DIMENSIONAL DIFFRACTION; TOMOGRAPHY RECONSTRUCTION;

ELECTRON DIFFRACTION; GRAIN BOUNDARIES; IMAGE RECONSTRUCTION; MICROSTRUCTURE; TOMOGRAPHY;

CHARACTERIZATION;

EID: 84880517664     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S002188981301580X     Document Type: Article

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