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Volumn 441, Issue 1-3, 2013, Pages 380-389

Technetium and ruthenium incorporation into rutile TiO2

Author keywords

[No Author keywords available]

Indexed keywords

BINARY CLUSTERS; DEFECT CLUSTER; DEFECT CLUSTERING; EXPERIMENTAL DATUM; NEAREST NEIGHBOUR; SECONDARY PHASE; SOLUTION LIMITS; TEMPERATURE DEPENDENT;

EID: 84880382951     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2013.06.022     Document Type: Article
Times cited : (16)

References (33)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.