Identifying and correcting scan noise and drift in the scanning transmission electron microscope

Microscopy and Microanalysis

Volumn 19, Issue 4, 2013, Pages 1050-1060

  Jones, Lewys ^a   Nellist, Peter D ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Image distortion; Image resolution; Sample drift; Scan noise; Scanning transmission electron microscopy (STEM); Signal to noise ratio

Indexed keywords

EID: 84880288240     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927613001402     Document Type: Conference Paper

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