A strategy to prepare wafer scale bismuth compound superstructures

Small

Volumn 9, Issue 14, 2013, Pages 2394-2398

  Guo, Chuan Fei ^a   Zhang, Jianming ^a   Wang, Meng ^a,b   Tian, Ye ^a   Liu, Qian ^a,b  

^a NATIONAL CENTER FOR NANOSCIENCE AND TECHNOLOGY   (China)

^b NANKAI UNIVERSITY   (China)

Author keywords

epitaxial growth; mismatch dislocations; single crystalline films; superstructures

Indexed keywords

EPITAXIAL WAFERS; MISMATCH DISLOCATIONS; SINGLE-CRYSTALLINE; SINGLE-CRYSTALLINE FILM; SUPERSTRUCTURES; THERMAL CRYSTALLIZATION; UNIQUE MORPHOLOGIES; WAFER SCALE;

AMORPHOUS FILMS; CRYSTALLINE MATERIALS; EPITAXIAL GROWTH;

BISMUTH COMPOUNDS;

EID: 84880255936     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.201300777     Document Type: Article

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