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Volumn 2012, Issue 605 CP, 2012, Pages 91-97

Survey of the electrical apparatus reliability developments in China

Author keywords

Development history; Electrical apparatus; Prospect; Reliability

Indexed keywords

DEVELOPMENT HISTORY; ELECTRICAL APPARATUS; PROSPECT;

EID: 84880219165     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1049/cp.2012.0629     Document Type: Conference Paper
Times cited : (1)

References (8)
  • 5
    • 0031233053 scopus 로고    scopus 로고
    • Closure to discussion of survey results of low-voltage circuit breakers as found during maintenance testing: Working group report
    • Pat O'Donnell, W.F.Braun, C.R.Heising, et al. Closure to Discussion of "Survey Results of Low-voltage Circuit Breakers as Found during Maintenance Testing: Working Group Report". IEEE Transactions on Industry Applications. 1997, (33)5: 1372.
    • (1997) IEEE Transactions on Industry Applications , vol.33 , Issue.5 , pp. 1372
    • O'donnell, P.1    Braun, W.F.2    Heising, C.R.3
  • 6
    • 0031232772 scopus 로고    scopus 로고
    • Discussion of "survey results of low-voltage circuit breakers as found during maintenance testing: Working group report
    • Charles J. Nochumson. Discussion of "Survey Results of Low-voltage Circuit Breakers as Found during Maintenance Testing: Working Group Report". IEEE Transactions on Industry Applications. 1997, (33)5: 1370~1371.
    • (1997) IEEE Transactions on Industry Applications , vol.33 , Issue.5 , pp. 1370-1371
    • Nochumson, C.J.1
  • 7
    • 0031235213 scopus 로고    scopus 로고
    • Survey results of low- voltage circuit breakers as found during maintenance testing: Working group report
    • Pat O'Donnell, W.F.Braun, C.R.Heising, et al. Survey Results of Low- voltage Circuit Breakers as Found during Maintenance Testing: Working Group Report. IEEE Transactions on Industry Applications. 1997, (33)5: 1367~1369.
    • (1997) IEEE Transactions on Industry Applications , vol.33 , Issue.5 , pp. 1367-1369
    • O'donnell, P.1    Braun, W.F.2    Heising, C.R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.