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Volumn 28, Issue 13, 2013, Pages 1792-1798

Hall-Petch analysis of dislocation pileups in thin material layers and in nanopolycrystals

Author keywords

grain size; nanostructure; strength

Indexed keywords

DISLOCATION PILEUP; GRAIN SIZE; SINGLE DISLOCATION; STRAIN RATE SENSITIVITY; STRENGTH; STRESS INTENSITY; THIN FILM MATERIAL; THROUGH-THICKNESS;

EID: 84880191166     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/jmr.2013.10     Document Type: Article
Times cited : (29)

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