Background spectra for rapid- or step-scan ftir depth profiling

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 1145, Issue , 1989, Pages 362-363

  Carter, R O ^a   Palmer, R A ^b   Dittmar, R M ^b   Manning, C J ^b   Bains, S S ^b   Chao, J L ^c  

^a FORD MOTOR COMPANY   (United States)

^b DUKE UNIVERSITY   (United States)

^c IBM   (United States)

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EID: 84880187598     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.969501     Document Type: Conference Paper

References (0)