Optimized local ternary patterns: A new texture model with set of optimal patterns for texture analysis

Journal of Computer Science

Volumn 9, Issue 1, 2013, Pages 1-15

  Madasamy Raja, G ^a   Sadasivam, V ^b  

^a MET Engineering College   (India)

^b MANONMANIAM SUNDARANAR UNIVERSITY   (India)

Author keywords

G Statistic similarity measurement; Level of optimality; Local binary patterns (LBP); Local ternary patterns (LTP); Texture classification; Transition length

Indexed keywords

EID: 84880099247     PISSN: 15493636     EISSN: None     Source Type: Journal    
DOI: 10.3844/jcssp.2013.1.15     Document Type: Article

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