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Volumn 578, Issue , 2013, Pages 59-65

Electronic structure of substitutional group-1B impurities in β-Silicon carbide

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION EFFECT; CUBIC-SIC; IMPURITIES IN; INTERMEDIATE BANDS; MAIN EFFECT; OPTOELECTRONIC PROPERTIES;

EID: 84879908189     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2013.05.065     Document Type: Article
Times cited : (1)

References (40)
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    • 0003597031 scopus 로고
    • INSPEC, the Institution of Electrical Engineers London, United Kingdom
    • G.L. Harris Properties of Silicon Carbide 1995 INSPEC, the Institution of Electrical Engineers London, United Kingdom
    • (1995) Properties of Silicon Carbide
    • Harris, G.L.1
  • 7
    • 0003269304 scopus 로고
    • Metal impurities in Silicon-Device fabrication
    • Klaus Graff, Metal impurities in Silicon-Device fabrication. Springer Series in Materials Science 24, 1995, 31.
    • (1995) Springer Series in Materials Science , vol.24 , pp. 31
    • Graff, K.1
  • 35
    • 84892237915 scopus 로고    scopus 로고
    • Second Ed. Springer-Verlag, Berlin Heidelberg, 2001
    • C. Hamaguchi, Basic Semiconductor Physics, Second Ed. Springer-Verlag, Berlin Heidelberg, 2001, 2010.
    • (2010) Basic Semiconductor Physics
    • Hamaguchi, C.1
  • 36
    • 0004116685 scopus 로고    scopus 로고
    • Springer, Berlin, 1993; Madelung, O. Introduction to Solid-State-Theory; Springer Series in Solid State Sciences, vol. 2; Springer-Verlag
    • Flude, P. Electron Correlation in Molecules and Solids; Solid-State Series, vol. 100; Springer, Berlin, 1993; Madelung, O. Introduction to Solid-State-Theory; Springer Series in Solid State Sciences, vol. 2; Springer-Verlag, 1996.
    • (1996) Electron Correlation in Molecules and Solids; Solid-State Series , vol.100
    • Flude, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.