Microstructure and dielectric relaxation of dipolar defects in Mn-doped (1 - X)Pb(Mg1/3Nb2/3)O3-xPbTiO3 single crystals

Scripta Materialia

Volumn 69, Issue 5, 2013, Pages 377-380

  Li, Xiaobing ^a   Zhao, Xiangyong ^a   Ren, Bo ^a   Luo, Haosu ^a   Ge, Wenwei ^b   Jiang, Zheng ^c   Zhang, Shuo ^c  

^a SHANGHAI INSTITUTE OF CERAMICS   (China)

^b State University   (United States)

^c SHANGHAI INSTITUTE OF APPLIED PHYSICS   (China)

Author keywords

Dipolar defects; Ferroelectric; Single crystals: dielectric loss relaxation spectrum; X ray absorption fine structure

Indexed keywords

ATOMIC-SCALE DEFECTS; CHARGE-DIPOLE; DIPOLAR DEFECTS; DOPING EFFECTS; RELAXATION SPECTRUM; TEMPERATURE DEPENDENT; X RAY ABSORPTION FINE STRUCTURES; X-RAY ABSORPTION FINE STRUCTURE ANALYSIS;

ATOMIC PHYSICS; DEFECTS; DIELECTRIC DEVICES; DIELECTRIC LOSSES; FERROELECTRIC MATERIALS; LEAD; MANGANESE; NIOBIUM; OXYGEN VACANCIES; X RAY ABSORPTION;

SINGLE CRYSTALS;

EID: 84879887314     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2013.05.018     Document Type: Article

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